模擬測試交換格式的研究與實現
發(fā)布時間：2018-12-18 07:00
【摘要】：隨著電子技術的飛速發(fā)展,電子產品領域的不斷擴大,電子技術已經深入到航空、醫(yī)療、教育等各個方面,但是由于電路系統(tǒng)的不斷更新,其結構也越來越復雜,這給電路測試、維護帶來了更大的困難。僅僅依靠人為修復故障設備已經無法滿足社會需求,尤其是軍工、航空等領域,設備出現故障時需要迅速的定位與修復。 目前電路故障診斷系統(tǒng)主要分為電路仿真和后處理兩大部分,電路仿真部分主要完成電路仿真、數據結果采集、知識處理等,后處理部分主要完成智能診斷和TPS測試執(zhí)行,仿真和后處理之間的信息交互就顯得十分重要。目前數字電路發(fā)展較快,其仿真系統(tǒng)和測試格式已經相當成熟,然而模擬電路由于其自身輸入信號的連續(xù)性、不可窮舉性,故障模型復雜等特點,致使故障診斷相對發(fā)展較慢,模擬測試交換格式(ATIF)至今沒有一個標準。 為了提高自動測試系統(tǒng)對模擬電路故障診斷的效率和水平,本課題研究定義一種模擬測試的交換機制,為基于仿真測試程序集的開發(fā)和數據傳遞提供信息和數據格式。本文針對目前科研項目,對模擬故障電路診斷系統(tǒng)進行接口設計,研究電路仿真和后處理部分與AT工F數據之間的通信關系,制定AT工F文件的存儲內容以及文件之間的相互關系,實現了交互數據的統(tǒng)一管理與調度。由于模擬電路故障復雜多變,為了保證ATIF數據的全面與測試的有效性,本文通過SPICE仿真引擎采用多激勵注入對電路進行蒙特卡洛仿真分析,將仿真數據進行小波分析提取特征,并采用人工智能診斷算法BPN.SVM.AIS進行知識生成與評價。最終根據自定義的ATIF交換格式實現ATIF文件自動生成,最后用ATIF數據對一個模擬電路實例進行故障診斷,實驗結果證明了模擬測試交換格的有效性。
[Abstract]:With the rapid development of electronic technology and the expansion of electronic products field, electronic technology has been deeply into aviation, medical treatment, education and other aspects, but because of the continuous updating of circuit system, its structure is becoming more and more complex. This brings greater difficulties to circuit testing and maintenance. It is impossible to meet the needs of the society only by artificial repair equipment, especially in the fields of military industry, aviation and so on. When the equipment breaks down, it needs to be located and repaired quickly. At present, the circuit fault diagnosis system is mainly divided into two parts: circuit simulation and post-processing. Circuit simulation mainly completes circuit simulation, data acquisition, knowledge processing and so on. The post-processing part mainly completes intelligent diagnosis and TPS test execution. The information interaction between simulation and post-processing is very important. At present, the digital circuit is developing rapidly, and its simulation system and test format have been quite mature. However, the analog circuit is relatively slow in fault diagnosis because of its characteristics of continuity of input signal, non-exhaustive, complex fault model, etc. The Analog Test Interchange format (ATIF) is not yet a standard. In order to improve the efficiency and level of the automatic test system for analog circuit fault diagnosis, this paper studies and defines an exchange mechanism of analog testing, which provides information and data format for the development and data transmission of simulation test assembly. According to the current scientific research project, this paper designs the interface of analog fault circuit diagnosis system, and studies the communication relationship between circuit simulation and post-processing part and AT data. The storage contents of AT files and the relationship between them are established, and the unified management and scheduling of interactive data are realized. Because the fault of analog circuit is complex and changeable, in order to ensure the validity of ATIF data and test, this paper uses multi-excitation injection to analyze the circuit through SPICE simulation engine, and carries out wavelet analysis to extract the features of the simulation data. And the artificial intelligence diagnosis algorithm BPN.SVM.AIS is used to generate and evaluate the knowledge. Finally, the automatic generation of ATIF files is realized according to the custom ATIF exchange format. Finally, an analog circuit example is diagnosed with ATIF data. The experimental results show that the simulation test switch lattice is effective.
【學位授予單位】：北方工業(yè)大學
【學位級別】：碩士
【學位授予年份】：2015
【分類號】：TN710
[Abstract]:With the rapid development of electronic technology and the expansion of electronic products field, electronic technology has been deeply into aviation, medical treatment, education and other aspects, but because of the continuous updating of circuit system, its structure is becoming more and more complex. This brings greater difficulties to circuit testing and maintenance. It is impossible to meet the needs of the society only by artificial repair equipment, especially in the fields of military industry, aviation and so on. When the equipment breaks down, it needs to be located and repaired quickly. At present, the circuit fault diagnosis system is mainly divided into two parts: circuit simulation and post-processing. Circuit simulation mainly completes circuit simulation, data acquisition, knowledge processing and so on. The post-processing part mainly completes intelligent diagnosis and TPS test execution. The information interaction between simulation and post-processing is very important. At present, the digital circuit is developing rapidly, and its simulation system and test format have been quite mature. However, the analog circuit is relatively slow in fault diagnosis because of its characteristics of continuity of input signal, non-exhaustive, complex fault model, etc. The Analog Test Interchange format (ATIF) is not yet a standard. In order to improve the efficiency and level of the automatic test system for analog circuit fault diagnosis, this paper studies and defines an exchange mechanism of analog testing, which provides information and data format for the development and data transmission of simulation test assembly. According to the current scientific research project, this paper designs the interface of analog fault circuit diagnosis system, and studies the communication relationship between circuit simulation and post-processing part and AT data. The storage contents of AT files and the relationship between them are established, and the unified management and scheduling of interactive data are realized. Because the fault of analog circuit is complex and changeable, in order to ensure the validity of ATIF data and test, this paper uses multi-excitation injection to analyze the circuit through SPICE simulation engine, and carries out wavelet analysis to extract the features of the simulation data. And the artificial intelligence diagnosis algorithm BPN.SVM.AIS is used to generate and evaluate the knowledge. Finally, the automatic generation of ATIF files is realized according to the custom ATIF exchange format. Finally, an analog circuit example is diagnosed with ATIF data. The experimental results show that the simulation test switch lattice is effective.
【學位授予單位】：北方工業(yè)大學
【學位級別】：碩士
【學位授予年份】：2015
【分類號】：TN710
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