A scalable large-signal model of AlGa N/Ga N High electron mobility transistors（HEMTs）suitable for multi-harmonic characterizations is presented.This model is fulfilled utilizing an improved drain-source current（Ids） formulation with a geometry-dependent thermal resistance（Rth） and charge-trapping modification.The Idsmodel is capable of accurately modeling the highorder transconductance（gm）,which is significant for the prediction of multi-harmonic characteristics.The thermal resistance is identi... 

【文章來源】：Chinese Journal of Electronics. 2017年05期 第952-959頁

【文章頁數(shù)】：8 頁

【文章目錄】：
1. Drain-source current
2. Geometry-dependent thermal resistance
3. Trapping effect dispersive model
4. Extrinsic and intrinsic parasitic parameters


【參考文獻】：
期刊論文
[1]Ku波段寬帶氮化鎵功率放大器MMIC[J]. 余旭明,洪偉,王維波,張斌.  電子學報. 2015(09)
[2]An Improved Gate Charge Model of HEMTs by Direct Formulating the Branch Charges[J]. LIU Linsheng.  Chinese Journal of Electronics. 2014(04)
[3]基于GaN HEMT的1.5-3.5GHz寬帶平衡功率放大器設計[J]. 冷永清,張立軍,曾云,魯輝,鄭占旗,張國梁,彭偉,彭亞濤,官勁.  電子學報. 2013(04)
[4]AlGaN/GaN高電子遷移率晶體管解析模型[J]. 楊燕,王平,郝躍,張進城,李培咸.  電子學報. 2005(02)



本文編號：2907351