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晶體振蕩器溫度補(bǔ)償技術(shù)的研究

發(fā)布時(shí)間:2018-09-17 08:28
【摘要】:晶體振蕩器廣泛應(yīng)用于宇航、儀器儀表、雷達(dá)、通信等領(lǐng)域。溫度補(bǔ)償晶體振蕩器具有功耗低、啟動(dòng)迅速、便于集成等優(yōu)勢(shì),是目前常用的振蕩器之一。本文首先研究了晶體諧振器串聯(lián)負(fù)載電容的等效變換。前人們采用近似計(jì)算,并對(duì)此等效變換做了一些研究。本文在推導(dǎo)過(guò)程中發(fā)現(xiàn):提取復(fù)阻抗方程的隱含條件后,即使不采用近似計(jì)算,一個(gè)方程也能求解四個(gè)未知數(shù)。其中的隱含條件為:復(fù)阻抗方程對(duì)任意頻率皆成立。最終,本文證明了此種等效變換的適用范圍與諧振器Q值、諧振頻率、電容比等都無(wú)關(guān),且適用于符合Butterworth-Van Dyke(BVD)模型的所有壓電諧振器。然后,本文研究了基于零相位頻率的晶體諧振器等效參數(shù)測(cè)量方法。早期人們采用晶體阻抗計(jì)測(cè)量等效參數(shù),目前國(guó)際電工委員會(huì)推薦使用矢量網(wǎng)絡(luò)分析儀測(cè)量等效參數(shù)。由于采用了近似計(jì)算,在諧振器Q值較低時(shí),上述方法的理論誤差變大。本文提出了一種基于諧振頻率、反諧振頻率、負(fù)載諧振頻率、負(fù)載反諧振頻率測(cè)量晶體諧振器等效參數(shù)的方法。由于推導(dǎo)過(guò)程中沒(méi)有近似計(jì)算,所以本方法不受諧振器Q值影響,仿真實(shí)驗(yàn)也驗(yàn)證了這一點(diǎn)。通過(guò)相位-頻率曲線的導(dǎo)數(shù)方程解決了頻率隨機(jī)游動(dòng)與負(fù)載電容標(biāo)稱(chēng)值不精確問(wèn)題之后,本文測(cè)量了一個(gè)5MHz晶體諧振器與一個(gè)10MHz晶體諧振器的等效參數(shù)。測(cè)試結(jié)果表明,本文方法所測(cè)等效參數(shù)與供應(yīng)商提供的等效參數(shù)基本一致。由于這兩個(gè)諧振器的M值、Q值皆較高,因而供應(yīng)商的測(cè)試誤差也會(huì)較小。因此,實(shí)測(cè)實(shí)驗(yàn)間接證明了本方法的有效性。本方法通過(guò)頻率測(cè)量動(dòng)態(tài)電阻R1,而頻率是目前測(cè)量最準(zhǔn)的物理量之一,因此本方法對(duì)提高測(cè)試精度有一定的益處。除此之外,比較成熟的頻率測(cè)量方法也使得本方法操作較為簡(jiǎn)便。本文在理論上驗(yàn)證了此方法的優(yōu)勢(shì),初步實(shí)驗(yàn)也驗(yàn)證了其可行性。接下來(lái),本文分析了影響溫度補(bǔ)償晶體振蕩器頻率溫度穩(wěn)定度的主要因素——溫滯效應(yīng)。通過(guò)分析發(fā)現(xiàn),傳感器一維溫度信息不能完整描述諧振器四維溫度分布。這導(dǎo)致了同一溫度對(duì)應(yīng)不同的輸出頻率。在此基礎(chǔ)上,本文提出了一種實(shí)時(shí)溫度補(bǔ)償方法,以保持測(cè)試環(huán)境的一致性。然后,本文設(shè)計(jì)了一種100MHz低相噪溫度補(bǔ)償晶體振蕩器。實(shí)驗(yàn)結(jié)果表明,本實(shí)驗(yàn)原型的頻率溫度穩(wěn)定度、相位噪聲達(dá)到或超過(guò)國(guó)際同類(lèi)產(chǎn)品。文末,本文分析了Trim效應(yīng)。通過(guò)分析發(fā)現(xiàn):Trim效應(yīng)的原因是壓控振蕩器壓控特性曲線的非線性。一個(gè)初步的實(shí)驗(yàn)也驗(yàn)證了此種推斷。最后,本文分析了二維補(bǔ)償技術(shù)使溫度補(bǔ)償晶體振蕩器輸出多個(gè)頻率的可能性。
[Abstract]:Crystal oscillators are widely used in aerospace, instrumentation, radar, communications and other fields. Temperature-compensated crystal oscillator is one of the commonly used oscillators because of its advantages of low power consumption, quick starting and easy integration. In this paper, the equivalent transformation of the series load capacitor of crystal resonator is studied. Previous people used approximate calculation, and did some research on the equivalent transformation. In this paper, it is found that after extracting the implicit conditions of complex impedance equation, even if the approximate calculation is not used, one equation can solve four unknowns. The implicit condition is that the complex impedance equation holds for any frequency. Finally, it is proved that the applicable range of the equivalent transformation is independent of the resonator Q value, resonant frequency, capacitance ratio and so on, and it is suitable for all piezoelectric resonators in accordance with the Butterworth-Van Dyke (BVD) model. Then, the method of measuring the equivalent parameters of crystal resonator based on zero phase frequency is studied. In the early stage, the crystal impedance meter was used to measure the equivalent parameters, and the current International Electrotechnical Commission recommended the use of vector network analyzer to measure the equivalent parameters. Because of the approximate calculation, the theoretical error of the above method becomes larger when the Q value of the resonator is low. In this paper, a method for measuring the equivalent parameters of crystal resonator based on resonant frequency, antiresonant frequency and load antiresonant frequency is presented. Since there is no approximate calculation in the derivation, the method is not affected by the resonator Q value, and the simulation results show that this method is not affected by the Q value of the resonator. After solving the problem of random walk of frequency and imprecision of nominal value of load capacitance by derivative equation of phase frequency curve, the equivalent parameters of a 5MHz crystal resonator and a 10MHz crystal resonator are measured in this paper. The test results show that the equivalent parameters measured by this method are basically consistent with those provided by suppliers. Because the M value and Q value of the two resonators are both high, the testing error of the supplier will be smaller. Therefore, the effectiveness of the method is proved indirectly by the experimental results. The dynamic resistance R1 is measured by frequency, and the frequency is one of the most accurate physical quantities, so this method can improve the precision of measurement. In addition, the more mature frequency measurement method also makes this method easier to operate. In this paper, the advantages of this method are theoretically verified, and the feasibility of the method is verified by preliminary experiments. Then, the temperature hysteresis effect, which is the main factor affecting the temperature stability of the temperature compensated crystal oscillator, is analyzed. It is found that the one-dimensional temperature information of the sensor can not completely describe the four-dimensional temperature distribution of the resonator. This results in a different output frequency at the same temperature. On this basis, a real-time temperature compensation method is proposed to maintain the consistency of the test environment. Then, a 100MHz low phase noise temperature compensated crystal oscillator is designed. The experimental results show that the frequency and temperature stability and phase noise of the prototype reach or exceed those of the international products. At the end of the paper, the Trim effect is analyzed. It is found that the reason of the ratio Trim effect is the nonlinearity of the voltage-control characteristic curve of the VCO. A preliminary experiment also verifies this inference. Finally, the possibility of using two-dimensional compensation technique to output multiple frequencies of temperature compensated crystal oscillator is analyzed.
【學(xué)位授予單位】:電子科技大學(xué)
【學(xué)位級(jí)別】:博士
【學(xué)位授予年份】:2017
【分類(lèi)號(hào)】:TN752

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