多波長條紋投影三維測(cè)量中相位展開技術(shù)的研究
發(fā)布時(shí)間：2018-07-28 19:18
【摘要】：隨著現(xiàn)代科學(xué)研究的深入和工業(yè)生產(chǎn)水平的不斷提高,人們對(duì)于物體三維形貌準(zhǔn)確測(cè)量的需求日益強(qiáng)烈,基于數(shù)字條紋投影的三維形貌測(cè)量技術(shù)作為新一代非接觸式三維形貌測(cè)量技術(shù),由于其高分辨率、無破壞、數(shù)據(jù)獲取速度快、實(shí)現(xiàn)簡單等優(yōu)點(diǎn)而被認(rèn)為是最有前途的三維形貌測(cè)量方法之一,已經(jīng)被廣泛應(yīng)用于工業(yè)自動(dòng)檢測(cè)、產(chǎn)品質(zhì)量監(jiān)控、機(jī)器視覺、逆向設(shè)計(jì)、生物醫(yī)學(xué)等眾多領(lǐng)域�；跀�(shù)字條紋投影的三維形貌測(cè)量技術(shù)是利用投影機(jī)向待測(cè)物體投影一組光強(qiáng)呈正弦規(guī)律變化的條紋,并用相機(jī)同時(shí)拍攝經(jīng)物體表面形貌調(diào)制的變形條紋,然后利用條紋分析技術(shù)和相位展開技術(shù)從變形條紋中求解出包含物體表面三維信息的絕對(duì)相位,結(jié)合標(biāo)定參數(shù)計(jì)算出待測(cè)物體表面的三維點(diǎn)云數(shù)據(jù)。其中,相位展開技術(shù)直接決定重構(gòu)的三維形貌數(shù)據(jù)的準(zhǔn)確性,是三維測(cè)量過程中關(guān)鍵的步驟之一。本論文詳細(xì)介紹了基于數(shù)字條紋投影的三維形貌測(cè)量的基本原理、經(jīng)典的條紋分析技術(shù)和相位展開技術(shù),分析了現(xiàn)有的相位展開方法中存在的問題,然后針對(duì)傳統(tǒng)的時(shí)間相位展開算法需要投影和拍攝的圖片數(shù)目過多,實(shí)時(shí)性差等問題對(duì)如何在最小化所需圖片數(shù)目的同時(shí)提升相位展開的抗噪性行了深入研究。首先通過對(duì)現(xiàn)有的多頻率投影條紋相位展開算法的分析,特別是針對(duì)基于空間頻率選擇的雙頻率條紋投影相位展開算法中對(duì)條紋設(shè)計(jì)約束較大、相位誤差容限不夠高等問題提出一種基于空間波長選擇的雙波長條紋投影算法。論文詳細(xì)介紹了該方法的基本原理和實(shí)現(xiàn)步驟,表明該方法無需復(fù)雜計(jì)算,僅是通過不等式的求解建立表征包裹相位圖和條紋階數(shù)之間一一對(duì)應(yīng)關(guān)系的查找表即可快速完成相位展開操作；論文分析了所選兩個(gè)條紋空間波長的約束條件和相位展開的相位誤差容忍范圍,指出所選兩個(gè)條紋空間波長的最大公約數(shù)越大,則可容忍的最大相位誤差就越大,并通過實(shí)驗(yàn)驗(yàn)證了該方法的有效性。雙波長條紋投影相位展開算法減少了對(duì)投影條紋設(shè)計(jì)的約束、降低了相位展開過程的計(jì)算復(fù)雜度、提高了現(xiàn)有獲取展開相位算法的速度、增強(qiáng)了抗噪性,是一種有價(jià)值的時(shí)間相位展開算法。通過對(duì)基于空間波長選擇的雙波長條紋投影相位展開算法的進(jìn)一步研究發(fā)現(xiàn),如果想要更大程度的提升算法的抗噪性,雙波長法不得不增大投影條紋的空間波長,而空間波長的增加將會(huì)導(dǎo)致三維測(cè)量性噪比的降低,因此,文章提出了基于空間波長選擇的三波長條紋投影相位展開算法,相對(duì)于雙波長法能獲得更好的抗噪性和測(cè)量性噪比。因此,當(dāng)雙波長算法能夠從兩幅六步相移技術(shù)得到的包裹相位圖中成功恢復(fù)絕對(duì)相位(即僅需12幅條紋圖)時(shí),三波長算法可以從三幅三步相移技術(shù)得到的包裹相位圖中成功恢復(fù)絕對(duì)相位,僅僅需要投影和采集9幅圖片即可實(shí)現(xiàn)正確的相位展開,三維形貌測(cè)量的效率得到提高。文章同樣對(duì)該算法的基本原理、空間波長選擇的約束條件和抗噪性做了詳細(xì)的分析論證。在基于空間波長選擇的三波長條紋投影相位展開算法中,通過實(shí)驗(yàn)發(fā)現(xiàn)盡管該算法能夠成功的恢復(fù)出絕對(duì)相位,但結(jié)果中依然存在少數(shù)規(guī)律性的錯(cuò)誤恢復(fù)點(diǎn),研究發(fā)現(xiàn)這些錯(cuò)誤點(diǎn)的產(chǎn)生與空間波長的選擇有關(guān),歸因于外差現(xiàn)象的出現(xiàn),可以通過更合理的選擇條紋空間波長來規(guī)避這些錯(cuò)誤,但卻會(huì)加大對(duì)條紋設(shè)計(jì)的約束�；诖�,通過對(duì)相對(duì)誤差率的計(jì)算我們提出了利用數(shù)據(jù)插值的方法修正相位展開的錯(cuò)誤點(diǎn)或利用質(zhì)量模板的方法移除這些錯(cuò)誤點(diǎn),實(shí)驗(yàn)證明這些處理規(guī)律性相位展開錯(cuò)誤點(diǎn)的方法對(duì)含有龐大點(diǎn)云數(shù)據(jù)的三維測(cè)量結(jié)果影響很小。以上研究對(duì)基于空間波長選擇的多波長投影條紋時(shí)間相位展開方法進(jìn)行了完整的論證說明,為該方法在三維形貌測(cè)量中的應(yīng)用奠定了理論和實(shí)驗(yàn)基礎(chǔ)。在本文的最后對(duì)全文的研究工作進(jìn)行了總結(jié),并指出了后續(xù)研究的方向。
[Abstract]:With the deepening of modern scientific research and the continuous improvement of the level of industrial production, the demand for accurate measurement of three-dimensional shape of objects is becoming more and more intense. The 3D topography measurement technology based on digital fringe projection is a new generation of non-contact 3D topography measurement technology. Because of its high resolution, no destruction and fast data acquisition, the data acquisition speed is fast. It is considered to be one of the most promising methods of 3D topography measurement, which has been widely used in many fields, such as industrial automatic detection, product quality monitoring, machine vision, reverse design, biomedicine and so on. The 3D topography measurement technology based on digital fringe projection is a group of light intensity projection from projector to the object to be measured. The stripe, which is changed by the sine law, is photographed by the camera at the same time. Then the absolute phase of the three-dimensional information containing the surface of the object is solved by the fringe analysis technique and the phase unwrapping technique, and the three dimensional point cloud data of the surface of the object are calculated with the calibration parameters. It is one of the key steps in the process of three-dimensional measurement to directly determine the accuracy of the reconstructed 3D topography data. In this paper, the basic principle of 3D topography measurement based on the digital fringe projection, the classic fringe analysis technique and the phase unwrapping technique are introduced in detail, and the existing problems in the existing phase unwrapping method are analyzed. In view of the traditional time phase unwrapping algorithm, the number of pictures which need to be projected and photographed is too much, and the problem of real time is poor. This paper makes an in-depth study on how to improve the noise resistance of phase unwrapping at the same time to minimize the number of pictures needed. In the dual frequency fringe projection phase unwrapping algorithm for spatial frequency selection, a two wavelength fringe projection algorithm based on spatial wavelength selection is proposed. The basic principle and implementation steps of the method are introduced in detail. The phase unwrapping operation can be quickly completed by establishing a lookup table representing a one-to-one correspondence between the phase diagram and the order of the stripe. The paper analyzes the constraints of the wavelength of the two stripes and the range of phase error tolerance of the phase unwrapping, and points out the maximum common divisor of the two spatial wavelengths of the selected stripe. The larger the maximum phase error tolerable, the greater the maximum phase error is, and the effectiveness of the method is verified by experiments. The dual wavelength fringe projection phase unwrapping algorithm reduces the constraint on the design of the projection stripe, reduces the computational complexity of the phase unwrapping process, improves the speed of the existing phase algorithm and enhances the noise resistance. It is a kind of noise resistance. A valuable time phase unwrapping algorithm is obtained. By further study of the dual wavelength fringe projection phase unwrapping algorithm based on the spatial wavelength selection, it is found that if the enhancement of the noise resistance of the algorithm is greater, the dual wavelength method has to increase the space wavelength of the projection stripe, and the increase of the space wavelength will result in the three-dimensional measurement noise. As a result, the three wavelength fringe projection phase expansion algorithm based on space wavelength selection is proposed, which can obtain better noise and measurement noise ratio compared with the dual wavelength method. Therefore, when the dual wavelength algorithm can successfully recover the absolute phase (that is, only 12 stripes are needed in the package phase bitmap obtained from two six step phase shift techniques. " As a result, the three wavelength algorithm can successfully restore the absolute phase in the package phase graph obtained from the three three step phase shift technique. Only the projection and acquisition of 9 pictures can achieve the correct phase unwrapping, and the efficiency of the 3D topography measurement is improved. The basic principle of the algorithm, the constraint conditions of the space wavelength selection and the resistance are also given. In the three wavelength fringe projection phase unwrapping algorithm based on space wavelength selection, it is found that although the algorithm can successfully restore the absolute phase, there are still a few regular error recovery points in the result. The study found that the error points are produced and the space wavelengths are selected. Due to the appearance of heterodyne, we can avoid these errors by more reasonable selection of the fringe space wavelengths, but it will increase the constraints on the design of the stripes. Based on this, we propose a method to correct the error points of the phase opening by the method of data interpolation or remove this method by calculating the relative error rate. Some error points have been proved by experiments. The experimental results show that the method of handling the error points of the regular phase is very small on the three-dimensional measurement results containing large point cloud data. The above study is a complete demonstration of the multi wavelength projection fringe time phase unwrapping method based on the spatial wavelength selection. Based on the theoretical and experimental foundation, the paper summarizes the research work and points out the direction for further research.
【學(xué)位授予單位】：華中科技大學(xué)
【學(xué)位級(jí)別】：博士
【學(xué)位授予年份】：2016
【分類號(hào)】：TP391.41
[Abstract]:With the deepening of modern scientific research and the continuous improvement of the level of industrial production, the demand for accurate measurement of three-dimensional shape of objects is becoming more and more intense. The 3D topography measurement technology based on digital fringe projection is a new generation of non-contact 3D topography measurement technology. Because of its high resolution, no destruction and fast data acquisition, the data acquisition speed is fast. It is considered to be one of the most promising methods of 3D topography measurement, which has been widely used in many fields, such as industrial automatic detection, product quality monitoring, machine vision, reverse design, biomedicine and so on. The 3D topography measurement technology based on digital fringe projection is a group of light intensity projection from projector to the object to be measured. The stripe, which is changed by the sine law, is photographed by the camera at the same time. Then the absolute phase of the three-dimensional information containing the surface of the object is solved by the fringe analysis technique and the phase unwrapping technique, and the three dimensional point cloud data of the surface of the object are calculated with the calibration parameters. It is one of the key steps in the process of three-dimensional measurement to directly determine the accuracy of the reconstructed 3D topography data. In this paper, the basic principle of 3D topography measurement based on the digital fringe projection, the classic fringe analysis technique and the phase unwrapping technique are introduced in detail, and the existing problems in the existing phase unwrapping method are analyzed. In view of the traditional time phase unwrapping algorithm, the number of pictures which need to be projected and photographed is too much, and the problem of real time is poor. This paper makes an in-depth study on how to improve the noise resistance of phase unwrapping at the same time to minimize the number of pictures needed. In the dual frequency fringe projection phase unwrapping algorithm for spatial frequency selection, a two wavelength fringe projection algorithm based on spatial wavelength selection is proposed. The basic principle and implementation steps of the method are introduced in detail. The phase unwrapping operation can be quickly completed by establishing a lookup table representing a one-to-one correspondence between the phase diagram and the order of the stripe. The paper analyzes the constraints of the wavelength of the two stripes and the range of phase error tolerance of the phase unwrapping, and points out the maximum common divisor of the two spatial wavelengths of the selected stripe. The larger the maximum phase error tolerable, the greater the maximum phase error is, and the effectiveness of the method is verified by experiments. The dual wavelength fringe projection phase unwrapping algorithm reduces the constraint on the design of the projection stripe, reduces the computational complexity of the phase unwrapping process, improves the speed of the existing phase algorithm and enhances the noise resistance. It is a kind of noise resistance. A valuable time phase unwrapping algorithm is obtained. By further study of the dual wavelength fringe projection phase unwrapping algorithm based on the spatial wavelength selection, it is found that if the enhancement of the noise resistance of the algorithm is greater, the dual wavelength method has to increase the space wavelength of the projection stripe, and the increase of the space wavelength will result in the three-dimensional measurement noise. As a result, the three wavelength fringe projection phase expansion algorithm based on space wavelength selection is proposed, which can obtain better noise and measurement noise ratio compared with the dual wavelength method. Therefore, when the dual wavelength algorithm can successfully recover the absolute phase (that is, only 12 stripes are needed in the package phase bitmap obtained from two six step phase shift techniques. " As a result, the three wavelength algorithm can successfully restore the absolute phase in the package phase graph obtained from the three three step phase shift technique. Only the projection and acquisition of 9 pictures can achieve the correct phase unwrapping, and the efficiency of the 3D topography measurement is improved. The basic principle of the algorithm, the constraint conditions of the space wavelength selection and the resistance are also given. In the three wavelength fringe projection phase unwrapping algorithm based on space wavelength selection, it is found that although the algorithm can successfully restore the absolute phase, there are still a few regular error recovery points in the result. The study found that the error points are produced and the space wavelengths are selected. Due to the appearance of heterodyne, we can avoid these errors by more reasonable selection of the fringe space wavelengths, but it will increase the constraints on the design of the stripes. Based on this, we propose a method to correct the error points of the phase opening by the method of data interpolation or remove this method by calculating the relative error rate. Some error points have been proved by experiments. The experimental results show that the method of handling the error points of the regular phase is very small on the three-dimensional measurement results containing large point cloud data. The above study is a complete demonstration of the multi wavelength projection fringe time phase unwrapping method based on the spatial wavelength selection. Based on the theoretical and experimental foundation, the paper summarizes the research work and points out the direction for further research.
【學(xué)位授予單位】：華中科技大學(xué)
【學(xué)位級(jí)別】：博士
【學(xué)位授予年份】：2016
【分類號(hào)】：TP391.41
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